Ionic contamination is one of the most critical and overlooked reliability threats in electronic assemblies. In this article, we explain what it is, how it affects the long-term performance of your devices, how to detect it in the lab, and what measures can be implemented to reduce its impact. What is Ionic Contamination? In electronics […]
At NUFESA Labs, Failure Analysis is a key service we provide to support the reliability of electronic assemblies. In this case study, we present a typical example involving a 12-layer board that failed in the field. The problem The first step was to narrow down the issue, which we did in collaboration with the customer. […]
Process validation in PCB manufacturing is essential to ensure the reliability of electronic products. One of the most common tasks in these validation plans is the detection of tin whiskers, microscopic formations that can cause short circuits and field failures. In this article, we explore how Nufesa Labs conducts tin whisker detection and analysis in […]