Ionic contamination
Ionic contamination tests in electronics are performed to detect and quantify the presence of contaminant ions on the surfaces of electronic components and printed circuit boards (PCBs). These ions, such as chlorides, sulfates, or nitrates, can come from manufacturing processes, handling, or the environment, and their presence can cause corrosion, short circuits, and device malfunction.
To determine the ionic contamination of a PCB or components some tests can be done, depending on the objective and zones to evaluate.
C3
The C3 test (Cubic Crystal Counter) is a test primarily used to detect and quantify ionic contamination on small surfaces of printed circuit boards (PCBs) and electronic components. This test focuses on measuring ionic residues present on the circuit substrate.
ROSE
The ROSE test (Resistivity of Solvent Extract) is a test used to measure the ionic contamination present on the surfaces of printed circuit boards (PCBs) and electronic assemblies. This test is used to verify the cleanliness of the boards after the soldering or assembly process, with the aim of identifying any ionic residues that could affect the reliability of the product.
IC
The IC test (Ion Chromatography) is a technique used to detect and quantify the presence of contaminant ions on the surfaces of PCBAs. This test is especially useful for identifying specific ions, such as chlorides, sulfates, nitrates, among others, and help us to determine the origin of the contamination.
